
KSD-T7F001-000 3
SUF1002
Electrical Characteristics (Ta=25°C)
Characteristic Symbol Test Condition Min. Typ. Max. Unit
Drain-source breakdown voltage BVDSS ID=250µA, VGS=0 30 - - V
Gate threshold voltage VGS(th) ID=250µA, VDS= VGS 1.0 - 3.0 V
Drain-source cut-off current IDSS V
DS=30V, VGS=0V - - 1
µA
Gate leakage current IGSS VDS=0V, VGS=±20V - -
±100 nA
VGS=10V, ID=2.9A - 24 30
mΩ
Drain-source on-resistance RDS(ON)
VGS=5.0V, ID=2.9A - 28 34
mΩ
Forward transfer conductance ④ gfs V
DS=5V, ID=5.8A - 12 - S
Input capacitance Ciss - 370 560
Output capacitance Coss - 60 90
Reverse transfer capacitance Crss
VGS=0V, VDS=10V,
f=1MHz
- 36 54
pF
Turn -on del ay time td(on) - 1.2 -
Rise time tr - 1.1 -
Turn-off delay time td(off) - 2.5 -
Fall time tf
VDD=15V, ID=5.8A
RG=10Ω
③④
- 1.1 -
ns
Total gate charge Qg - 4.2 6.3
Gate-source charge Qgs - 0.9 1.4
Gate-drain charge Qgd
VDS=15V, VGS=5V
ID=5.8A
③④ - 1.4 2.1
nC
Source-Drain Diode Ratings and Characteristics (Ta=25°C)
Characteristic Symbol Test Condition Min Typ Max Unit
Source current IS - - 1.5
Source current(Plused) ① ISM
Integral reverse diode
in the MOSFET - - 6.0
A
Forward voltage ④ VSD V
GS=0V, IS=1.5A - - 1.2 V
Reverse recovery time trr - 90 - ns
Reverse recovery charge Qrr
Is=1.5A
diS/dt=100A/us - 0.5 - uC
Note ;
① Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature
② L=3.4mH, IAS=5.8A, VDD=15V, RG=25Ω
③ Pulse Test : Pulse Width< 300us, Duty cycle≤2%
④ Essentially independent of operating temperature